LIBS Technique for Fast Impurities Identification in Metallurgic Grade Silicon
In this paper we report a new fast in line characterization tools for feedstock analysis based on the Laser induced breakdown spectroscopy. We applied this technique to the characterization of metallurgic grade silicon feedstock with the aim of valuate the applicability of this technique in the photovoltaic industry as in-line portable characterization tool. Different silicon grade feedstock were analyzed and selectivity and detection limit for the main impurities present in the silicon feedstock were determined.